Founded in 1977, Aehr Test Systems is dedicated to innovating cost-effective solutions for semiconductor testing and burn-in processes. The company develops, manufactures, and sells systems designed to reduce the cost of testing Dynamic Random Access Memory (DRAM) and other memory devices. Their products enable integrated circuit manufacturers to perform test and burn-in of bare die, screening complex logic and memory devices. Aehr Test Systems focuses on markets such as automotive sensors, mobile and AR/VR 3D sensors, and optical communications.

Notable figures associated with Aehr Test Systems include its experienced leadership team with decades of expertise in semiconductor testing. The company has achieved significant milestones, including being recognized as a leader in Silicon Carbide (SiC) wafer level burn-in and test screening. Their proven solutions have had a substantial impact on improving the quality and reliability of semiconductor devices, particularly in the automotive and optical communication sectors.