Anchor Semiconductor›Anchor Semiconductor› offers Pattern Centric Yield Manager

Pattern Centric Yield Manager begins by building a Design Decomposition Database that represents each layer of interest as a collection of unique constituent patterns. It then scores each pattern using geometric signatures, OPC simulation results, and empirical pattern fidelity data extracted from real-silicon SEM images.

The resulting pattern risk scores support data mining, trend analysis, care-area generation for optical and e-beam inspection, improved SEM review sampling, and feedback to OPC and lithography teams. PCYM helps foundries and integrated device manufacturers identify weak patterns, compare tape-outs against established designs, and focus resources on highest-risk areas.