Chipmetrics

This page lists Chipmetrics’ applications, including the PillarHall test chip and other metrology solutions.

The PillarHall LHAR5 test chip improves ALD process control, conformality measurement, and sustainability in next-generation 3D memory fabrication.

Pocket wafers with discrete ALD test chips enable rapid characterization of conformality and surface chemistry on 200/300 mm tools without consuming product wafers.

Explore Chipmetrics' products and services, designed to advance precision in semiconductor metrology and thin-film technology.

Chipmetrics hosted a webinar on November 29, 2023, featuring Professor Riikka Puurunen, inventor of PillarHall test chips, discussing conformality modeling.

Chipmetrics’ 300 mm pocket wafer approach provides fast and accurate qualification of thin film properties in semiconductor manufacturing, where flawless execution across hundreds of steps is critical.

Meiden Nanoprocess Innovations Inc. specializes in high-concentration, high-purity ozone generators for applications in semiconductor surface modification and film formation.

Atomic layer deposition (ALD) is essential for conformal coatings in advanced semiconductor technologies, though traditional thermal-ALD faces limitations in high-temperature applications.

Chipmetrics established a subsidiary, Chipmetrics GmbH, in Dresden, Germany, to accelerate semiconductor tool qualification and process control using 3D metrology solutions.

Chipmetrics Oy’s PAKKA project, supported by the Finnish Centre for Economic Development, focuses on expanding 3D semiconductor metrology services from January 2024 to June 2025.

Professor Henrik Pedersen of Linköping University discusses how Chipmetrics’ PillarHall test chip advances process control and material deposition in semiconductor research.

Chipmetrics Oy received over 300,000 euros from the Finnish Centre for Economic Development for business and product development in semiconductor metrology.

Chipmetrics offers career opportunities for professionals in semiconductor metrology and thin-film technology.

Chipmetrics presented at ALD/ALE 2026 on high surface area micro-loading effects and platinum ALD, while also showcasing PillarHall user cases in other presentations.

Chipmetrics provides semiconductor 3D metrology solutions for process control using innovative test chips and wafers.

Chipmetrics Ltd. is headquartered in Joensuu, Finland, with operations led by Managing Director Mikko Utriainen.