Exnodes, founded with the mission to revolutionize wafer inspection, focuses on maximizing the yield of computer chips by detecting nanoscale defects. Utilizing a breakthrough in 8.9 nanometer sensitivity with visible light, their Computational Parallel Inspection® (CPI) technology offers unpatterned wafer inspection without the drawbacks of deep ultraviolet (DUV) methods. Exnodes provides advanced detection, classification, and root cause analysis using AI models, and licenses its patented technology to industry leaders in the semiconductor sector.
Notable figures associated with Exnodes include key industry experts and investors who have recognized the transformative potential of their technology. The company has achieved significant milestones, such as detecting 20 nanometer defects at a rate of 120 wafers per hour, positioning itself as a leader in the wafer inspection market. Exnodes' impact is evident in its contribution to accelerating semiconductor manufacturing processes, thereby supporting the advancement of next-generation electronic devices.
